Docente/Teacher

prof. Antonio AFFANNI

Crediti/Credits

6 CFU

Lingua/Language

Inglese/English

Obiettivi formativi specifici/Objectives

Measurand estimation and uncertainty evaluation in direct and indirect measurements. Architecture, characteristics and limitations of measurement instrumentation: analog oscilloscope, digital oscilloscope, digital multimeter in AC and DC measurements. Frequency and period measurements. Impedance measurement methods: subsitution, voltamperometric, bridges. AC and DC impedance bridges, autobalancing LCR bridges. Automatic measurements through calculator and IEEE 488. Electronic components characterization: non idealities in OPAMPs, ADCs and DACs.

Competenze acquisite/Acquired skills

- Use of general purpose instrumentation.
- Set up of basic electronic measurements.
- Expression of measurement results.
- Reading instrumentation specifications.

Programma/Lectures and exercises (topics and specific content)

General principles on measurements: introduction to metrology and definitions; international metrology organizations; the SI system;  estimation of uncertainty in direct and indirect measurements, uncertainty propagation (8 hours).
Time domain signal analysis: analog oscilloscope, architecture and uncertainty in measurements; digital oscilloscope; architecture, non idealities, A/D conversion, sampling, interpolation, decimation (10 hours).
Current and voltage measurements: Digital MultiMeter: DVM architecture, ramp, V/f, dual slope, multislope; AC "true RMS" and rectified-mean measurements; AC and DC current measurements, resistance measurements in two-wires and four-wires configurations (6 hours).
Period and frequency measurements: conventional counter and reciprocal counter: frequency, period, time interval measurements;  architecture and uncertainty evaluation; time interpolation (6 hours).
Impedance measurements: DC methods, substitution, voltamperometric, bridge; AC and DC bridges, Wheatstone, Wien, Gott, Maxwell and Schering;  Autobalancing bridges and LCR meters (6 hours).
Electronic components characterization: OPAMPs, measurements of static and dynamic non idealities; DACs and ADCs, architecture and non idealities, INL, DNL, SNR, SINAD, ENOB (4 hours).
Labs (20 hours).

Bibliografia/References

- Slides of lectures
- U. Pisani, Misure Elettriche ed Elettroniche, Politeko
- D. Mirri, G. Iuculano, Misure Elettroniche, Cedam

Modalità d'esame/Type of exam

written and oral